Advantest Chairman Toshio Maruyama Appointed Chairman of Semiconductor Equipment Association of Japan
TOKYO--(BUSINESS WIRE)-- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857, NYSE: ATE) announced today that its chairman and representative director, Toshio Maruyama, has been appointed chairman of the Semiconductor Equipment Association of Japan (SEAJ), effective May 29th. He previously was a member of the board of directors (from 2011) and has served as vice-chairman since 2012.
Founded in 1985, SEAJ is an organization of Japanese semiconductor production equipment (SPE) suppliers, flat panel display (FPD) and solar-photovoltaic (PV) manufacturing equipment manufacturers, and related equipment manufacturers. Its mission is to promote the development of these industries through research, promotion, analysis, and educational activities, among others.
As a long-standing member of SEAJ, Advantest welcomes Maruyama’s appointment to the association’s top post. The company looks forward to continuing its fruitful partnership with SEAJ.
About Advantest Corporation
A world-class technology company, Advantest is the leading producer of automatic test equipment (ATE) for the semiconductor industry and a premier manufacturer of measuring instruments used in the design and production of electronic instruments and systems. Its leading-edge systems and products are integrated into the most advanced semiconductor production lines in the world. The company also focuses on R&D for emerging markets that benefit from advancements in nanotech and terahertz technologies, and has recently introduced multi-vision metrology scanning electron microscopes essential to photomask manufacturing, as well as a groundbreaking 3D imaging and analysis tool. Founded in Tokyo in 1954, Advantest established its first subsidiary in 1982, in the USA, and now has subsidiaries worldwide. More information is available at www.advantest.com.
All information supplied in this release is correct at the time of publication, but may be subject to change.
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